embedded instrumentation造句

• The applications for embedded instrumentation are extensive.
• This enables exploring extended debugging scenarios that can't be reached by traditional embedded instrumentation techniques.
• A working group of the IEEE has also undertaken the development of a standard that specifically addresses embedded instrumentation.
• Non-intrusive board test ( NBT ) employs embedded instrumentation to perform structural and electrical tests on circuit boards.
• In addition, embedded instrumentation is simply better suited to much of the computer and communications technologies that are emerging today.
• Moreover, embedded instrumentation is often more efficient and adaptable, since it is software-based, unlike external hardware testers.
• Embedded instrumentation can perform certain functions that external test and measurement technologies have difficulty with because they are external to the chip or circuit board being tested.
• A working group of the IEEE ( Institute of Electrical and Electronic Engineers ) that is developing a standard for accessing embedded instruments ( the IEEE P1687 Internal JTAG standard ) defines embedded instrumentation as follows:
• This robot is the result of a collaboration between ENSTA Bretagne and IFREMER . ENSTA-Bretagne ( OSM Team ) develops control algorithms and the software architecture, IFREMER ( LPO + RDT ) builds the mechanics, the embedded instrumentation.
• A later standard in the boundary-scan family, the IEEE 1149.6 Boundary-Scan Standard for Advanced Digital Networks, utilizes the 1149.1 boundary-scan embedded instrumentation infrastructure but expands the types of chip-to-chip interconnects that can be tested.
• "Any logic structure within a device whose purpose is Design for Test ( DFT ), Design-for-Debug ( DFD ), Design-for-Yield ( DFY ), Test & There exists the widespread use of embedded instrumentation ( such as BIST ( built-in self-test ) Engines, Complex I / O Characterization and Calibration, Embedded Timing Instrumentation, etc . ) ."
• Although it was not referred to as an embedded instrument at the time of its development, the IEEE 1149.1 Boundary Scan Standard can be seen as the first enabling technology for embedded instrumentation . ( Boundary scan is also referred to as JTAG, after the Joint Test Action Group which initially undertook its development before it came under the aegis of a working group of the IEEE .  JTAG is often used to designate the access port on a chip which conforms to the boundary-scan standard . ) Some would consider the boundary-scan test process as a form of embedded instrumentation.
• Although it was not referred to as an embedded instrument at the time of its development, the IEEE 1149.1 Boundary Scan Standard can be seen as the first enabling technology for embedded instrumentation . ( Boundary scan is also referred to as JTAG, after the Joint Test Action Group which initially undertook its development before it came under the aegis of a working group of the IEEE .  JTAG is often used to designate the access port on a chip which conforms to the boundary-scan standard . ) Some would consider the boundary-scan test process as a form of embedded instrumentation.